White Paper

Using Solid State Switching For Next Generation Wireless Test Applications

Test engineers are looking for ways to reduce the number of device under-test (DUT) connections and enable testing of multiple DUTs in parallel from a single test station. This is most often achieved by configuring RF switches in a switch matrix to automate the routing of test signals. This article will explore some of the key differences between the types of switches used in wireless test applications. Switch matrix configurations will be discussed, and a real-world switch matrix for a high-volume telecom test application described in detail.

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